Super high throughput smart handler will significantly improve throughput and running cost compared to conventional type handler, up to 304 devices is tested and programmed simultaneously
FEATURES
- High throughput
- Capable of transferring, testing and burn-programming up to 30,000 UPH*1
- Capable up to 304*1 devices simultaneously testing and burn-programming
- Ideal for testing and burn-programming flash memory embedded IC
- SPI, NAND, NOR flash memory
- Flash memory embedded MCU
- High reliable socketless contacting mechanism
- No Lead damage using original test tray