Super high throughput smart handler will significantly improve throughput and running cost compared to conventional type handler, up to 304 devices is tested and programmed simultaneously 


  •  High throughput
    •  Capable of transferring, testing and burn-programming up to 30,000 UPH*1
    •  Capable up to 304*1 devices simultaneously testing and burn-programming
  •  Ideal for testing and burn-programming flash memory embedded IC
    •  SPI, NAND, NOR flash memory
    •  Flash memory embedded MCU
  •  High reliable socketless contacting mechanism
    •  No Lead damage using original test tray